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Information for ruling 600011705

This section is Advance Tariff Ruling

Start date
29 Oct 2024
Expiry date
28 Oct 2027
Description
Four point probe stand. The Multi height Probe is a stand designed for holding a four point probe to introduce the probe to a semiconducting sample in a controlled manner The unit comprises a large hard anodised aluminium base, a stainless-steel upright pole, and a black acetal raising and lowering mechanism which attaches the pole at user defined heights, samples of varying thickness can therefore be measured. The four point probe is lowered onto the test sample and the four needles make a spring loaded electrical contact. The objective is to pass a constant current (maximum 100 milliamps) through two of the four needles and measure a voltage drop across the remaining two needles in order to assess the resistivity or sheet resistance of the test sample.
Keywords
  • WAFER PROBERS
  • OF STAINLESS STEEL
  • SEMICONDUCTOR WAFERS
  • SCIENTIFIC AND MEASURING EQUIPMENT
  • STANDS
  • SEMICONDUCTOR DEVICES
  • FOR TESTING
  • ALUMINIUM
Justification
Classification has been determined in accordance with the following: For the purposes of determining the commodity codes within which goods most appropriately fall, reg 3 (1) of The Customs Tariff (Establishment) (EU Exit) Regulations 2020 sets out that the rules of interpretation contained in the following have effect – a. Part Two (Goods Classification Table Rules of Interpretation) of the Tariff of the United Kingdom (Reg 3(1)(a)); and b. Notes to a section or chapter of the Goods Classification Table (Reg 3(1)(b)). General Interpretative Rules (GIRs) GIR 1 has been used to classify this product by the terms of heading 8538: Parts suitable for use solely or principally with the apparatus of heading 8535, 8536 or 8537 GIR 6 has been used to classify the goods to subheading level 853890: Other than boards, panels, consoles, desks, cabinets and other bases for the goods of heading 8537, not equipped with their apparatus 8-digit code 85389019: For wafer probers; Other than electronic assemblies Also classified in accordance with: Section Note 2(b) to Section XVI Harmonized System Explanatory Note (HSENs) to heading 8538